#nanoWIRES news

19ENG05 WP Leaders Web-meeting

Wednesday, the 3th of March 2021

In this meeting the final program of the “Workshop on High throughput metrology for nanowire energy harvesting devices” at the CIM Conference, 7-9 September 2021 in Lyon, France, has been defined.

Workshop on High throughput metrology for nanowire energy harvesting devices

9 September 2021

20th International Metrology Congress CIM2021, Lyon, France

Energy harvesting from renewable sources (solar, heat and movement) is a prominent solution to create small amounts of electrical energy in areas of difficult access, and energy harvesting devices have much potential to address our world energy problems.

Nanowire (NW) based energy harvesting systems have achieved encouraging progress, but due to nanometre dimensions of the wires and large size up to m^2 of the devices, they also bring challenges for testing and characterisation.

Average properties of energy harvesting devices can be measured, but a quantitative link and correlation between the performance of single NWs and that of the overall device is lacking.

This project aims to develop reliable and high throughput metrology for the quality control of NW energy harvesting systems.



Uwe Brand, Coordinator of EMPIR project 19ENG05 NanoWires (PTB Braunschweig, Germany)


Overview EMPIR project “19ENG05 NanoWires”

Uwe Brand (PTB Braunschweig, Germany)

High throughput metrology for NWs


High throughput nanodimensional characterisation of NWs

Richard Koops (VSL B.V., Delft, Netherlands), …


High throughput reliable nanoelectrical characterisation of NW solar cells

François Piquemal (LNE, Paris, France), …


High throughput nanoelectromechanical measurement methods

Zhi Li (PTB, Braunschweig, Germany)


Fast areal thermal imaging of NWs

Petr Klapetek (CMI, Brno, Czech Republic)



Nanowires fabrication and characterization

Jose Penuelas, Noelle Gogneau, L. Boarino, E. Peiner (C2N-CNRS, Université Paris Saclay, Palaiseau, France)


Innovative AFM probes for characterization of nanostructured materials

Chris Schwalb (GETec Microscopy GmbH, Darmstadt, Germany)


Conductive AFM for nanoelectrical measurement of NWs

Didier Pellerin (Scientec/CSInstruments, France)


High-speed piezoresistive microprobes for nanodimensional and nanomechanical measurement of NWs

Erwin Peiner (TUBS/LENA, Braunschweig, Germany)


Discussion of project aims and opportunities


End of Workshop


End of Workshop