#nanoWIRES news
19ENG05 WP Leaders Web-meeting
Wednesday, the 3th of March 2021
In this meeting the final program of the “Workshop on High throughput metrology for nanowire energy harvesting devices” at the CIM Conference, 7-9 September 2021 in Lyon, France, has been defined.
Workshop on High throughput metrology for nanowire energy harvesting devices
9 September 2021
20th International Metrology Congress CIM2021, Lyon, France
Energy harvesting from renewable sources (solar, heat and movement) is a prominent solution to create small amounts of electrical energy in areas of difficult access, and energy harvesting devices have much potential to address our world energy problems.
Nanowire (NW) based energy harvesting systems have achieved encouraging progress, but due to nanometre dimensions of the wires and large size up to m^2 of the devices, they also bring challenges for testing and characterisation.
Average properties of energy harvesting devices can be measured, but a quantitative link and correlation between the performance of single NWs and that of the overall device is lacking.
This project aims to develop reliable and high throughput metrology for the quality control of NW energy harvesting systems.
15:00
Welcome
Uwe Brand, Coordinator of EMPIR project 19ENG05 NanoWires (PTB Braunschweig, Germany)
15:02
Overview EMPIR project “19ENG05 NanoWires”
Uwe Brand (PTB Braunschweig, Germany)
High throughput metrology for NWs
15:05
High throughput nanodimensional characterisation of NWs
Richard Koops (VSL B.V., Delft, Netherlands), …
15:20
High throughput reliable nanoelectrical characterisation of NW solar cells
François Piquemal (LNE, Paris, France), …
15:35
High throughput nanoelectromechanical measurement methods
Zhi Li (PTB, Braunschweig, Germany)
15:50
Fast areal thermal imaging of NWs
Petr Klapetek (CMI, Brno, Czech Republic)
Applications
16:05
Nanowires fabrication and characterization
Jose Penuelas, Noelle Gogneau, L. Boarino, E. Peiner (C2N-CNRS, Université Paris Saclay, Palaiseau, France)
16:20
Innovative AFM probes for characterization of nanostructured materials
Chris Schwalb (GETec Microscopy GmbH, Darmstadt, Germany)
16:30
Conductive AFM for nanoelectrical measurement of NWs
Didier Pellerin (Scientec/CSInstruments, France)
16:40
High-speed piezoresistive microprobes for nanodimensional and nanomechanical measurement of NWs
Erwin Peiner (TUBS/LENA, Braunschweig, Germany)
16:50
Discussion of project aims and opportunities
17:00
End of Workshop
17:00
End of Workshop