A PEEK ON the lab
Central Office of Measures
LAB and RESEARCH
National Metrology Institute of Poland
The Central Office of Measurements (GUM) performs tasks in the scope of scientific, industrial and Required accuracy of measurement in Poland by realization and maintenance of measurementstandards and dissemination of measurement (this regards the SI units and other legal units of measurement).
GUM performs calibrations and expert assessments of measuring instruments,conformity assessment of measuring instruments and type approval and verification of measuringinstruments.
The objective of the Central Office of Measures as the National Metrology Institute is to provide the sources of traceability of measurement on the highest possible level for measurements in the area of economy.
Focused ion beam (FIB)/scanning electron microscopy (SEM) and the Scanning Mhermal microscopy (SThM) head for nanowires investigations.
Metrology of Individual Nanofibers
As partner in the NanoWire project, the Central Office of Measures (GUM), in cooperation with the Department of Nanometrology at the Faculty of Electronics of Microsystems and Photonics of the WrocławUniversity of Technology (PWR) and with suport of the Łukasiewicz Research Network, will conduct research on the metrology of individual nanofibers used for energy harvesting.
The common tasks of the teams will be:
production of recognizable substrates for placement of nanowires and assembly of nanowires on these substrates using the SEM/FIB technology;
modification of the SThM tips and cantilevers for the nanowire investigations using FIB/SEM technology
developing a new (reference) technique for measuring electrical properties of piezoelectric NWs in a magnetic field.
Measurements of Material Properties - Resonators
Split PostDdielectric Resonator (SPDR) for permittivity and loss tangent measurements of planar material samples at circa 2.5 GHz.
TE01δ Cavity Resonator for permittivity and loss tangent measurements of bulk material samples at circa 6.7 GHz.
Setup for permittivity and loss tangent measurements of planar dielectric and semiconducting samples employing SPDR and vector network analyzer.
Setup for permittivity and loss tangent measurements of bulk dielectric and semiconducting samples employing TE01δ cavity resonator and vector network analyzer.
Resonators can be used for contactless, non-destructive measurements of nano-wire structure at microwave frequencies.
Effective electrical permittivity and loss tangent of nano-wires together with the substrate can be measured using these techniques.
More information about resonators can be found at the links: